Through Optical Solutions Thin Film Thickness Can Be Determined

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There exist many forms of optical solutions which illustrate the thickness of your thin film and thick coating thickness. They are also helpful in studying the surface and interface behavior of a new thin film. A film's optical properties like refractive index that's denoted by letter N in addition to extinction coefficient i. e. K can also be explained by these solutions. The concentrations of an alloy as well as consistency across the surface are also determined with the aid of solutions provided. For those looking for picture gauge thickness measuring equipments can certainly go for devices meant for this specific purpose. Such devices allow to file film thickness and refractive index around 5 layers thick. You can learn more about polymer thickness via http://www.semiconsoft.com/wp/.

The film thickness gauge measures the dimension of various geometrical substances up to 300mm throughout diameter. It also computes various kinds of mapping patterns such because polar, linear, square and randomly coordinates. It has a detector technique too which accelerates the picture thickness measurement process. The tool with advanced optics is designed in a way that it greatly contributes in improving its system performance.

To study the optical properties of your thin film, a device named Microspectrophotometer is used. Same properties are studied for thick coatings spanning a micron region. Other names with this device are microreflectometer, micro-reflectometer, microspectrometer, microphotometer (Spectroscopic), microspectroscopic photometer and many others. A UV visible spectrophotometer is used as it covers from DUV to infrared ranges. The selection of range will depend on several factors like thickness associated with thin film, thick coating in addition to appropriate wavelength range for reflectance or transmittance.